Direct observation of thec(8×8) defect structure on Si(001) using scanning tunneling microscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.54.13468/fulltext
Reference15 articles.
1. Ordered-defect model for Si(001)-(2×8)
2. Structure, Stability, and Origin of (2×n) Phases on Si(100)
3. Reconstruction on Si(100) surfaces
4. Si(100)2 × n structures induced by Ni contamination
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