In situelectrical characterization of phase transformations in Si during indentation
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.67.085205/fulltext
Reference19 articles.
1. Crystal data for high-pressure phases of silicon
2. Structure and properties of silicon XII: A complex tetrahedrally bonded phase
3. Amorphization and Conductivity of Silicon and Germanium Induced by Indentation
4. New evidence for a pressure-induced phase transformation during the indentation of silicon
5. Electrical resistance of metallic contacts on silicon and germanium during indentation
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