Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction-Reference-Cited by-同舟云学术

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Phonon confinement effects in ultrathin epitaxial bismuth films on silicon studied by time-resolved electron diffraction

Published:2009-07-22 Issue:2 Volume:80 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Krenzer B.,Hanisch-Blicharski A.,Schneider P.,Payer Th.,Möllenbeck S.,Osmani O.,Kammler M.,Meyer R.,Horn-von Hoegen M.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.80.024307/fulltext

Reference64 articles.

1. Thin-film thermoelectric devices with high room-temperature figures of merit

2. Effect of phonon confinement on the thermoelectric figure of merit of quantum wells

3. Effect of quantum-well structures on the thermoelectric figure of merit

4. Nanoscale thermal transport

5. Phonon-engineered mobility enhancement in the acoustically mismatched silicon/diamond transistor channels

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