Measurement of the electron yield of CsI with polarized x rays

Author:

Hanany S.,Shaw P. S.,Liu Y.,Santangelo A.,Kaaret P.,Novick R.

Publisher

American Physical Society (APS)

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. General History of X-ray Polarimetry in Astrophysics;Handbook of X-ray and Gamma-ray Astrophysics;2024

2. General History of X-Ray Polarimetry in Astrophysics;Handbook of X-ray and Gamma-ray Astrophysics;2022-09-23

3. Astronomical X-ray polarimetry based on photoelectric effect with microgap detectors;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2001-08

4. The X-ray vectorial effect revisited;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2000-11

5. In situ probing of the near-surface properties of heterogeneous catalysts under reaction conditions: An introduction to total electron-yield XAS;Journal of Molecular Catalysis A: Chemical;1997-05

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