Determination of anomalous scattering factors in GaAs using x-ray refraction through a prism
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.31.3599/fulltext
Reference18 articles.
1. Anomalous scattering determinations of the pair distribution functions in amorphous GeSe
2. Reliability of partial structure factors determined by anomalous dispersion of x-rays
3. Application of Differential Anomalous X-Ray Scattering to Structural Studies of Amorphous Materials
4. Measurements of anomalous dispersion made with X-ray interferometers
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