Measuring minority-carrier diffusion length using a Kelvin probe force microscope
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.61.11041/fulltext
Reference18 articles.
1. Kelvin probe force microscopy
2. Atomic ordering of GaInP studied by Kelvin probe force microscopy
3. Silicon pn junction imaging and characterizations using sensitivity enhanced Kelvin probe force microscopy
4. Nanometer‐scale imaging of potential profiles in optically excited n‐i‐p‐i heterostructure using Kelvin probe force microscopy
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