Short-range local order of the Co/Si(111) interface studied by the extended Auger fine-structure technique
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.39.10398/fulltext
Reference28 articles.
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4. Extended x-ray-absorption fine-structure technique. III. Determination of physical parameters
5. Comment on "Spin-Polarized Auger Spectroscopy from Magnetically Ordered Solids"
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1. Formation of Co ultrathin films on Si(111): Growth mechanisms, electronic structure and transport;Applied Surface Science;2007-06
2. Determination of parameters of the local atomic surrounding in surface layers of Fe, Ni and Cu by the secondary electron fine structure method;Journal of Electron Spectroscopy and Related Phenomena;2002-08
3. Imaging of the structure of ultra-thin cobalt silicide films by inelastically backscattered electrons;Applied Surface Science;2001-05
4. SECONDARY ELECTRON FINE STRUCTURE—A METHOD OF LOCAL ATOMIC STRUCTURE CHARACTERIZATION;Handbook of Surfaces and Interfaces of Materials;2001
5. 3. Secondary electron fine structure—A method of local atomic structure characterization;Experimental Methods in the Physical Sciences;2001
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