Ion-induced atomic-likeLMMandL2MMAuger-electron emission from Mg, Al, Si, andMgxAl1−x: Role of symmetric and asymmetric collisions
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.48.9987/fulltext
Reference34 articles.
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1. Ion-induced Auger electrons contrast on cross-beam systems;Semiconductor Science and Technology;2019-11-20
2. Ionization in symmetric and nearly symmetric low energy ion–surface collisions;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-11
3. Non-additivity of multiply charged ion emission from Si and Al produced by molecular projectiles;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06
4. Double 2p electron excitation in low-energy Ne+ single scattering from a Si surface: an energy loss study;Surface Science;1997-12
5. The Auger (autoionization) spectra excited by argon and neon ion bombardment of a magnesium surface;Journal of Physics: Condensed Matter;1994-11-07
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