Absolute photoabsorption measurements of Mg, Al, and Si in the soft-x-ray region below theL2,3edges
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.49.16283/fulltext
Reference21 articles.
1. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92
2. Calculations of photoabsorption by atoms using a linear response method
3. A soft x-ray/EUV reflectometer based on a laser produced plasma source
4. Optical constants for thin films of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Ir, Os, Pt, and Au from 24 Å to 1216 Å
5. Angular dependent photoelectric yield and optical constants of Al between 40 and 600 eV
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