Raman phonon piezospectroscopy in GaAs: Infrared measurements
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.35.1362/fulltext
Reference18 articles.
1. Effect of static uniaxial stress on the Raman spectrum of silicon
2. Stress-Induced Shifts of First-Order Raman Frequencies of Diamond- and Zinc-Blende-Type Semiconductors
3. Raman Piezospectroscopy in GaAs Revisited
4. Raman Piezospectroscopy in GaAs Revisited
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