Regular pattern formation through the retraction and pinch-off of edges during solid-state dewetting of patterned single crystal films
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.82.193408/fulltext
Reference8 articles.
1. Capillary instabilities in thin films. I. Energetics
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