Ionic and electronic processes at ionic surfaces induced by atomic-force-microscope tips
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.56.15332/fulltext
Reference50 articles.
1. Force microscopy
2. Atomic force microscopy
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4. Interpretation of force curves in force microscopy
5. The AFM as a tool for surface imaging
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