Theory of the peroxy-radical defect ina-SiO2
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.26.6649/fulltext
Reference44 articles.
1. Oxygen-associated trapped-hole centers in high-purity fused silicas
2. Fundamental Defect Centers in Glass: The Peroxy Radical in Irradiated, High-Purity, Fused Silica
3. Fundamental defect centers in glass:Si29hyperfine structure of the nonbridging oxygen hole center and the peroxy radical ina-SiO2
4. Observation and analysis of the primary 29Si hyperfine structure of the E′ center in non-crystalline SiO2
5. E′center in glassy SiO2: Microwave saturation properties and confirmation of the primarySi29hyperfine structure
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