Intricate stepline artifact can mimic true atomic resolution in atomic force microscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.61.R5121/fulltext
Reference14 articles.
1. Simple theory for the atomic-force microscope with a comparison of theoretical and experimental images of graphite
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4. In touch with atoms
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