Uniqueness of the complex diffraction amplitude in x-ray Bragg diffraction
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.57.11178/fulltext
Reference21 articles.
1. Determination of dislocation loop size and density in ion implanted and annealed silicon by simulation of triple crystal X-ray rocking curves
2. Fitting of rocking curves from ion-implanted semiconductors
3. The phase problem
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