Tip size effect on the appearance of a STM image for complex surfaces: Theory versus experiment forSi(111)−(7×7)-Reference-Cited by-同舟云学术

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Tip size effect on the appearance of a STM image for complex surfaces: Theory versus experiment forSi(111)−(7×7)

Published:2004-08-30 Issue:7 Volume:70 Page:
ISSN:1098-0121
Container-title:Physical Review B
language:en
Short-container-title:Phys. Rev. B

Author:

Wang Y. L.,Gao H.-J.,Guo H. M.,Liu H. W.,Batyrev I. G.,McMahon W. E.,Zhang S. B.

Publisher

American Physical Society (APS)

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.70.073312/fulltext

Reference19 articles.

1. Surface Studies by Scanning Tunneling Microscopy

2. Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy

3. Atomistic Processes in the Early Stages of Thin-Film Growth

4. 7 × 7 Reconstruction on Si(111) Resolved in Real Space

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