X-ray diffraction from Si/Ge layers: Diffuse scattering in the region of total external reflection
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.51.2311/fulltext
Reference42 articles.
1. Critical Phenomena at Surfaces and Interfaces
2. Surface Studies of Solids by Total Reflection of X-Rays
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