Interpretation of frequency modulation atomic force microscopy in terms of fractional calculus
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.70.012303/fulltext
Reference12 articles.
1. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
2. Local Solvation Shell Measurement in Water Using a Carbon Nanotube Probe
3. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
4. Forces and frequency shifts in atomic-resolution dynamic-force microscopy
5. Quantity measured in frequency-shift-mode atomic-force microscopy: An analysis with a numerical model
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