Medium-energy backscattered electron diffraction as a probe of elastic strain in epitaxial overlayers
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.35.2490/fulltext
Reference9 articles.
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1. Diffraction effects in the incident and exit paths of electrons backscattered from Cu(001) at medium energies;Physical Review B;1999-08-15
2. First Results From a Retarding Field Angle-Resolved Analyzer;Materials Characterization;1999-04
3. Angular distribution of backscattered electrons with excitation of phonons and plasmons;Physical Review B;1998-12-15
4. Dimer structure of clean Si(001) surface studied by grazing-incidence back-scattering MEED;Journal of Electron Spectroscopy and Related Phenomena;1998-03
5. Excitation of phonons in medium-energy electron diffraction;Physical Review B;1996-03-15
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