Determination of mode-cutoff wavelengths and refractive-index profile of planar optical waveguides with a photon scanning tunneling microscope
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.51.11225/fulltext
Reference7 articles.
1. Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry
2. Index Profile Reconstruction of Ti: LiNbO3 Structures and Loss Bending Evaluation from Near-Field Measurements
3. An Evanescent Field Optical Microscope
4. Characterization of Si<formula><inf><roman>3</roman></inf></formula>N<formula><inf><roman>4</roman></inf></formula>/SiO<formula><inf><roman>2</roman></inf></formula> optical channel waveguides by photon scanning tunneling microscopy
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