Additional dimer-row structure of 3C-SiC(001) surfaces observed by scanning tunneling microscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.50.4548/fulltext
Reference19 articles.
1. High-Temperature Operation of Silicon Carbide MOSFET
2. Characterization of device parameters in high‐temperature metal‐oxide‐semiconductor field‐effect transistors in β‐SiC thin films
3. Electron spin resonance in electron‐irradiated 3C‐SiC
4. Fabrication of SiC Blue LEDs Using Off-Oriented Substrates
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