Electron backscattering from surfaces: The invariant-embedding approach
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.68.155409/fulltext
Reference22 articles.
1. Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopy
2. Quantitative analysis of the inelastic background in surface electron spectroscopy
3. Algorithm for analysis of low-energy-resolution REELS; determination of inelastic electron scattering cross-sections and applications in quantitative XPS
4. Inelastic-electron-scattering cross sections for Si, Cu, Ag, Au, Ti, Fe, and Pd
5. Electron transport processes in reflection electron energy loss spectroscopy (REELS) and X-ray photoelectron spectroscopy (XPS)
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