Formation of the 5×5 reconstruction on cleaved Si(111) surfaces studied by scanning tunneling microscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.42.5391/fulltext
Reference12 articles.
1. Structure analysis of Si(111)-7 × 7 reconstructed surface by transmission electron diffraction
2. Dimer-chain model for the 7×7 and the 2×8 reconstructed surfaces of reconstructed surfaces of Si(111) and Ge(111)
3. Newπ-Bonded Chain Model for Si(111)-(2×1) Surface
4. Structural Properties of Cleaved Silicon and Germanium Surfaces
5. The roughness of cleaved semiconductor surfaces
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