Ion-beam-induced modification of Ni silicides investigated by Auger-electron spectroscopy
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.28.4277/fulltext
Reference29 articles.
1. On the problem of whether mass or chemical bonding is more important to bombardment-induced compositional changes in alloys and oxides
2. Application of Auger electron spectroscopy to studies of the silicon/silicide interface
3. Preferential sputtering of PtSi, NiSi2, and AgAu
4. Stoichiometry and structural disorder effects on the electronic structure of Ni and Pd silicides
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