Calculated and measured Auger line shapes in SiO2
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.19.5375/fulltext
Reference69 articles.
1. Temperature dependence of the short wavelength transmittance limit of vacuum ultraviolet window materials—II theoretical, including interpretations for U.V. spectra of SiO2, GeO2, and Al2O3
2. The origin and intensities of low energy satellite lines in X-ray emission spectra: a molecular orbital interpretation
3. Electronic structure of defect centers in SiO2
4. Chemical Bonding Effects in the OxygenKαX-Ray Emission Bands of Silica
5. Electronic structure of SiO2. II. Calculations and results
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