Near-edge x-ray-absorption fine structure of crystalline silicon dioxides
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.52.11733/fulltext
Reference36 articles.
1. Photoemission Measurements of the Valence Levels of Amorphous SiO2
2. Electronic structure of SiO2,SixGe1−xO2, and GeO2from photoemission spectroscopy
3. X-ray photoelectron spectroscopy of silica in theory and experiment
4. X-ray spectroscopic investigation of the electronic structure of α-quartz and stishovite (SiO2)
5. X-ray emission bands and electronic structure of crystalline and vitreous silica (SiO2)
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