Nucleation and growth ofCu2O in the reduction of CuO thin films
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.45.5683/fulltext
Reference11 articles.
1. Oxygen-diffusion-induced phase boundary migration in copper oxide thin films
2. Diffusion induced recrystallization of NiO
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4. Oxygen depth profiling study of copper oxide films on silicon (100) substrates by 16O(α,α)16O resonance
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