Charge-carrier statistics atInAs∕GaAsquantum dots
Author:
Publisher
American Physical Society (APS)
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.72.075360/fulltext
Reference22 articles.
1. Statistics of the Recombinations of Holes and Electrons
2. Recombination in Semiconductors
3. Noise in solid-state microstructures: A new perspective on individual defects, interface states and low-frequency (1/ƒ) noise
4. Energy concepts of insulator–semiconductor interface traps
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1. Electron Eigenstates in Quantum Dots Revealed by Temperature Derivative Capacitance Spectroscopy;Journal of Nanoscience and Nanotechnology;2011-12-01
2. Thermal Stability of Metal-Silicide Nanocrystal Nonvolatile Memory with Barrier Engineered Tunnel Layers;Journal of Nanoscience and Nanotechnology;2011-10-01
3. Low-Dimensional Carrier Statistics in Nanostructures;Current Nanoscience;2011-04-01
4. Temperature Dependence of Electron Emission from InAs∕GaAs Quantum Dots;AIP Conference Proceedings;2011
5. Classification of Energy Levels in Quantum Dot Structures by Depleted Layer Spectroscopy;Journal of Electronic Materials;2010-03-04
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