High-precision determination of structure factorsFhof silicon
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.29.2102/fulltext
Reference33 articles.
1. A study of pendellösung fringes in X-ray diffraction
2. Electron-density studies. III. A re-evaluation of the electron distribution in crystalline silicon
3. Bonding Electron Distribution in Silicon
4. X-Ray Determination of Bond Charges in Silicon
5. Temperature Dependence of Bond charge Vibration in Silicon
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