Band offsets measured by internal photoemission-induced second-harmonic generation
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.67.045302/fulltext
Reference24 articles.
1. Characterization of semiconductor interfaces by second-harmonic generation
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3. Time-dependent second-harmonic generation from the Si–SiO_2 interface induced by charge transfer
4. Electron Photoinjection from Silicon to Ultrathin SiO2Films via Ambient Oxygen
5. Photoinduced trap generation at the Si-SiO 2 interface
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