Electroreflectance and ellipsometry of silicon from 3 to 6 eV
Author:
Publisher
American Physical Society (APS)
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.18.1824/fulltext
Reference71 articles.
1. Asymptotic convolution integral for electric field effects on the interband dielectric function
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