Scaling of surface roughness and polymer structure in a model for film growth and polymerization-Reference-Cited by-同舟云学术

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Scaling of surface roughness and polymer structure in a model for film growth and polymerization

Published:2009-08-19 Issue:2 Volume:80 Page:
ISSN:1539-3755
Container-title:Physical Review E
language:en
Short-container-title:Phys. Rev. E

Author:

Euzébio Jônatas A. R.,Aarão Reis F. D. A.

Publisher

American Physical Society (APS)

Subject

Industrial and Manufacturing Engineering,Metals and Alloys,Strategy and Management,Mechanical Engineering

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevE.80.021605/fulltext

Reference56 articles.

1. Initiated and Oxidative Chemical Vapor Deposition of Polymeric Thin Films: iCVD and oCVD

2. Morphology of poly(p-phenylenevinylene) thin films prepared directly on the surface of silicon wafers by the chemical vapor deposition polymerization

3. Growth of sculptured polymer submicronwire assemblies by vapor deposition

4. Surface Modification of Confined Microgeometries via Vapor-Deposited Polymer Coatings

5. Structure and Morphology of Poly(isobenzofuran) Films Grown by Hot-Filament Chemical Vapor Deposition

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Anomalous Kinetic Roughening by Chemical Reaction-Limited Aggregation;Journal of the Physical Society of Japan;2011-12-15

2. Thin-film growth by random deposition of rod-like particles on a square lattice;physica status solidi (c);2011-03-07

3. Thin-film growth by random deposition of linear polymers on a square lattice;Physical Review E;2010-05-14

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