Determination of the composition of light thin films with artificial neural network analysis of Rutherford backscattering experiments

Author:

Matias V.,Öhl G.,Soares J. C.,Barradas N. P.,Vieira A.,Cardoso S.,Freitas P. P.

Publisher

American Physical Society (APS)

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Analysis of sol–gel silica–titania films doped with Ag and Er using artificial neural networks;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-08

2. Artificial neural network analysis of RBS and ERDA spectra of multilayered multielemental samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-05

3. Artificial neural network analysis of multiple IBA spectra;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-01

4. A general artificial neural network for analysis of RBS data of any element with Z between 18 and 83 implanted into any lighter one- or two-element target;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06

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