On the Factors Affecting the Reflection Intensities by the Several Methods of X-Ray Analysis of Crystal Structures-Reference-Cited by-同舟云学术

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On the Factors Affecting the Reflection Intensities by the Several Methods of X-Ray Analysis of Crystal Structures

Published:1933-07-01 Issue:3 Volume:5 Page:169-202
ISSN:0034-6861
Container-title:Reviews of Modern Physics
language:en
Short-container-title:Rev. Mod. Phys.

Author:

Blake F. C.

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/RevModPhys.5.169/fulltext

Reference121 articles.

1. A New Method of X-Ray Crystal Analysis

Cited by 41 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Sonstige unmittelbare Eigenschaften der Elektronenhülle;Atom- und Molekularphysik;2013

3. X-ray and neutron attenuation correction factors for spherical samples;Journal of Applied Crystallography;2011-12-13

4. Deformation Behavior of Nanocomposites Studied by X-Ray Scattering: Instrumentation and Methodology;Nano- and Micromechanics of Polymer Blends and Composites;2009

5. Evaluation of self-attenuation parameters for neutron and X-ray scattering using a Direct Method. Application to slabs, cylinders and samples of any shape;Physica B: Condensed Matter;2006-06

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