Surface buckling of black phosphorus: Determination, origin, and influence on electronic structure-Reference-Cited by-同舟云学术

Surface buckling of black phosphorus: Determination, origin, and influence on electronic structure

Published:2017-12-29 Issue:7 Volume:1 Page:
ISSN:2475-9953
Container-title:Physical Review Materials
language:en
Short-container-title:Phys. Rev. Materials

Author:

Dai Zhongwei,Jin Wencan,Yu Jie-Xiang,Grady Maxwell,Sadowski Jerzy T.,Kim Young Duck,Hone James,Dadap Jerry I.,Zang Jiadong,Osgood Richard M.,Pohl Karsten

Funder

U.S. Department of Energy

National Science Foundation

Basic Energy Sciences

Office of Science

Publisher

American Physical Society (APS)

Subject

Physics and Astronomy (miscellaneous),General Materials Science

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevMaterials.1.074003/fulltext

Reference41 articles.

1. Black phosphorus field-effect transistors

2. Rediscovering black phosphorus as an anisotropic layered material for optoelectronics and electronics

3. Phosphorene: An Unexplored 2D Semiconductor with a High Hole Mobility

4. Black Phosphorus Radio-Frequency Transistors

5. Black Phosphorus–Monolayer MoS2 van der Waals Heterojunction p–n Diode

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