Characterization of Rydberg transitions in theL2,3absorption spectra ofSF6andPF5
Author:
Publisher
American Physical Society (APS)
Subject
Atomic and Molecular Physics, and Optics
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.44.7838/fulltext
Reference14 articles.
1. Resonances in photoabsorption spectra ofSiF4, Si(CH3)4, andSiCl4near the siliconKedge
2. High resolution gas phase photoabsorption spectra of SiCl4 and Si(CH3)4 at the silicon l edges: characterization and assignment of resonances
3. Multiple-scatteringXαstudy of the silicon and chlorine core-level photoabsorption spectra ofSiCl4
4. Single- and multiple-electron effects in the Si 1sphotoabsorption spectra of SiX4(X=H,D,F,Cl,Br,Ch3,C2H5,OCH3,OC2H5) molecules: Experiment and theory
5. Evidence of Effective Potential Barriers in the X‐Ray Absorption Spectra of Molecules
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3. Angular distribution measurements for spin-orbit-state-resolved S2pphotoelectrons ofSF6in the shape-resonance region;Physical Review A;2001-04-17
4. X-ray absorption study of potential barrier effect in group 14 tetrachlorides (GeCl4, SnCl4) and group 15 trichlorides (PCl3, AsCl3);Chemical Physics;1997-12
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