Above-threshold ionization, energy-resolved photoelectron angular distributions, and momentum distributions ofH2+in intense femtosecond laser pulses
Author:
Publisher
American Physical Society (APS)
Subject
Atomic and Molecular Physics, and Optics
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.79.063406/fulltext
Reference54 articles.
1. Energy-resolved photoelectron angular distributions of H+2in intense femtosecond laser pulses
2. Alignment dependence in above-threshold ionization of H+2: role of intermediate resonances
3. Effects of molecular symmetry on enhanced ionization by intense laser pulses
4. Ab initiostudy of the orientation effects in multiphoton ionization and high-order harmonic generation from the ground and excited electronic states ofH2+
5. Intense few-cycle laser fields: Frontiers of nonlinear optics
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Symmetries and Selection Rules of the Spectra of Photoelectrons and High-Order Harmonics Generated by Field-Driven Atoms and Molecules;Symmetry;2021-08-25
2. Alignment dependence of photoelectron momentum distributions of atomic and molecular targets probed by few-cycle circularly polarized laser pulses;Physical Review A;2016-08-22
3. Orientation-dependent forward-backward photoelectron holography from asymmetric molecules;Physical Review A;2014-03-24
4. Classical analysis of Coulomb effects in strong-field ionization of H2+by intense circularly polarized laser fields;Physical Review A;2013-09-10
5. Factorization of laser–pulse ionization probabilities in the multiphotonic regime;Journal of Physics B: Atomic, Molecular and Optical Physics;2013-08-27
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3