Electron excitation cross sections for the2s22p2Po→2s2p24Pand2s2p22Dtransitions inO3+
Author:
Publisher
American Physical Society (APS)
Subject
Atomic and Molecular Physics, and Optics
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.68.062708/fulltext
Reference16 articles.
1. The O IV and S IV intercombination lines in the ultraviolet spectra of astrophysical sources
2. Lines of OIV and SIV in the Goddard High-Resolution Spectrograph spectrum of RR Tel: constraints on atomic data
3. Mid-Infrared line diagnostics of active galaxies
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Spectroscopy of Ions Using Fast Beams and Ion Traps;Springer Handbook of Atomic, Molecular, and Optical Physics;2023
2. Relativistic R-matrix close-coupling method based on the effective many-body Hamiltonian: electron-impact excitation of the 3s2 1S0–3s3p1P1o electric dipole-allowed transition of the Ar6+ ion1This article is part of a Special Issue on the 10th International Colloquium on Atomic Spectra and Oscillator Strengths for Astrophysical and Laboratory Plasmas.;Canadian Journal of Physics;2011-04
3. RelativisticR-matrix close-coupling method based on the effective many-body Hamiltonian: electron-impact excitation of electric dipole-allowed and spin-forbidden transitions of the S4 +ion;Journal of Physics B: Atomic, Molecular and Optical Physics;2010-03-19
4. Energy levels, radiative rates, and excitation rates for transitions in O IV;Astronomy & Astrophysics;2008-05-29
5. RelativisticR-matrix close-coupling method based on the effective many-body Hamiltonian: Benchmarks on the electron-impact excitations of theKr6+ion;Physical Review A;2008-05-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3