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High-resolution total-cross-section measurements for electron scattering from Ar, Kr, and Xe employing a threshold-photoelectron source

  • Published:2011-12-29 Issue:6 Volume:84 Page:
  • ISSN:1050-2947
  • Container-title:Physical Review A
  • language:en
  • Short-container-title:Phys. Rev. A

Author:

Kurokawa M.,Kitajima M.,Toyoshima K.,Kishino T.,Odagiri T.,Kato H.,Hoshino M.,Tanaka H.,Ito K.

Publisher

American Physical Society (APS)

Subject

Atomic and Molecular Physics, and Optics

Cited by 46 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A semiempirical model for low energy electron–atom transport cross sections: The case of noble gases;Journal of Electron Spectroscopy and Related Phenomena;2024-09

2. Scale transformations in model exchange potentials in low energy electron-atom scattering;Journal of Electron Spectroscopy and Related Phenomena;2024-08

3. Calculation of electron scattering lengths on Ar, Kr, Xe, Rn and Og atoms;Journal of Physics B: Atomic, Molecular and Optical Physics;2024-07-30

4. High-resolution and high-precision measurements of total cross section for electron scattering from CO$$_2$$;The European Physical Journal D;2023-11

5. Angular distribution of photons emitted in collision of low-energy electrons with noble gases;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2023-06
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