Entanglement-enhanced quantum metrology in a noisy environment-Reference-Cited by-同舟云学术

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Entanglement-enhanced quantum metrology in a noisy environment

Published:2018-04-19 Issue:4 Volume:97 Page:
ISSN:2469-9926
Container-title:Physical Review A
language:en
Short-container-title:Phys. Rev. A

Author:

Wang Kunkun,Wang Xiaoping,Zhan Xiang,Bian Zhihao,Li Jian,Sanders Barry C.,Xue Peng

Funder

National Natural Science Foundation of China

Southeast University

East China Normal University

Publisher

American Physical Society (APS)

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.97.042112/fulltext

Reference49 articles.

1. Exponentially Enhanced Quantum Metrology

2. Quantum Metrology Assisted by Abstention

3. Random Bosonic States for Robust Quantum Metrology

4. Quantum-Enhanced Measurements: Beating the Standard Quantum Limit

5. Optimal Quantum Circuits for General Phase Estimation

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