Three-Dimensional Imaging of a Single Dopant in a Crystal-Reference-Cited by-同舟云学术

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Three-Dimensional Imaging of a Single Dopant in a Crystal

Published:2020-03-26 Issue:3 Volume:13 Page:
ISSN:2331-7019
Container-title:Physical Review Applied
language:en
Short-container-title:Phys. Rev. Applied

Author:

Ishikawa Ryo^ORCID,Shibata Naoya,Taniguchi Takashi,Ikuhara Yuichi

Funder

New Energy and Industrial Technology Development Organization

Japan Society for the Promotion of Science (JSPS) KAKENHI

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevApplied.13.034064/fulltext

Reference32 articles.

1. Single dopants in semiconductors

2. Luminescent Materials

3. Visibility of Single Atoms

4. Chemically sensitive structure-imaging with a scanning transmission electron microscope

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1. Three-dimensional atomic insights into the metal-oxide interface in Zr-ZrO2 nanoparticles;Nature Communications;2024-09-02

2. Three-dimensional crystal defect imaging by STEM depth sectioning;Chinese Physics B;2024-07-01

3. Imaging Point Defects in Quantum Materials Using Multislice Electron Ptychography;Microscopy and Microanalysis;2024-07

4. Three-dimensional atomic interface between metal and oxide in Zr-ZrO2 nanoparticles;2024-03-13

5. Real-time tracking of three-dimensional atomic dynamics of Pt trimer on TiO ₂ (110);Science Advances;2024-03

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