Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime-Reference-Cited by-同舟云学术

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Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime

Published:2010-12-10 Issue:6 Volume:82 Page:
ISSN:1050-2947
Container-title:Physical Review A
language:en
Short-container-title:Phys. Rev. A

Author:

Girard Jules,Maire Guillaume,Giovannini Hugues,Talneau Anne,Belkebir Kamal,Chaumet Patrick C.,Sentenac Anne

Publisher

American Physical Society (APS)

Subject

Atomic and Molecular Physics, and Optics

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.82.061801/fulltext

Reference19 articles.

1. Evanescent Waves

2. Beyond the Rayleigh Criterion: Grating Assisted Far-Field Optical Diffraction Tomography

3. Far-Field Optical Superlens

4. Far-Field Optical Hyperlens Magnifying Sub-Diffraction-Limited Objects

5. Focusing Beyond the Diffraction Limit with Far-Field Time Reversal

Cited by 23 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Padé approximants of the Born series of electromagnetic scattering by a diffraction grating;Physical Review A;2024-03-20

2. Far-field far-subwavelength spatial resolution using relative motion with structured illumination;Physical Review A;2024-02-09

3. Imaging Cloaked Objects: Diffraction Tomography of Realistic Invisibility Devices;Laser & Photonics Reviews;2022-12-03

4. 生物折射率三维无标记定量成像研究进展;Chinese Journal of Lasers;2022

5. Invariance Property of the Fisher Information in Scattering Media;Physical Review Letters;2021-12-01

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