High-Fidelity Single-Shot Readout for a Spin Qubit via an Enhanced Latching Mechanism-Reference-Cited by-同舟云学术

High-Fidelity Single-Shot Readout for a Spin Qubit via an Enhanced Latching Mechanism

Published:2018-05-21 Issue:2 Volume:8 Page:
ISSN:2160-3308
Container-title:Physical Review X
language:en
Short-container-title:Phys. Rev. X

Author:

Harvey-Collard Patrick,D’Anjou Benjamin,Rudolph Martin,Jacobson N. Tobias,Dominguez Jason,Ten Eyck Gregory A.,Wendt Joel R.,Pluym Tammy,Lilly Michael P.,Coish William A.,Pioro-Ladrière Michel,Carroll Malcolm S.

Funder

Natural Sciences and Engineering Research Council of Canada

Canadian Institute for Advanced Research

Canada First Research Excellence Fund

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevX.8.021046/fulltext

Reference40 articles.

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2. Single-spin measurement using single-electron transistors to probe two-electron systems

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5. Quantifying the quantum gate fidelity of single-atom spin qubits in silicon by randomized benchmarking

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