High resolution strain measurements in highly disordered materials
Author:
Funder
U.S. Department of Energy
Office of Science
Argonne National Laboratory
Publisher
American Physical Society (APS)
Subject
General Engineering
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevResearch.3.013119/fulltext
Reference15 articles.
1. Coherent X-ray diffraction imaging of strain at the nanoscale
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