Optimizing one-axis twists for variational Bayesian quantum metrology

Author:

Thurtell Tyler G.1ORCID,Miyake Akimasa1

Affiliation:

1. Department of Physics and Astronomy, Center for Quantum Information and Control, University of New Mexico, Albuquerque, New Mexico 87106, USA

Abstract

Quantum metrology and sensing seek advantages in estimating an unknown parameter of some quantum state or channel, using entanglement such as spin squeezing produced by one-axis twists or other quantum resources. In particular, qubit phase estimation, or rotation sensing, appears as a ubiquitous problem with applications to electric field sensing, magnetometry, atomic clocks, and gyroscopes. By adopting the Bayesian formalism to the phase estimation problem to account for limited initial knowledge about the value of the phase, we formulate variational metrology and treat the state preparation (or encoding) and measurement (or decoding) procedures as parameterized quantum circuits. It is important to understand how effective various parametrized protocols are as well as how robust they are to the effects of complex noise such as spatially correlated noise. First, we propose a family of parametrized encoding and decoding protocols called arbitrary-axis twist ansatzes, and show that it can lead to a substantial reduction in the number of one-axis twists needed to achieve a target estimation error. Furthermore, we demonstrate that the estimation error associated with these strategies decreases with system size in a faster manner than classical (or no-twist) protocols, even in the less-explored regimes where the prior information is limited. Last, using a polynomial-sized tensor network algorithm, we numerically analyze practical variational metrology beyond the symmetric subspace of a collective spin and find that quantum advantage persists for the arbitrary-axis twist ansatzes with a few one-axis twists and smaller total twisting angles for practically relevant noise levels. Published by the American Physical Society 2024

Funder

National Science Foundation

Publisher

American Physical Society (APS)

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