Method for Estimating Locations of Laser-Induced Stray Charges on Surface-Electrode Ion Traps Using Secular Frequency Shift at Multiple Ion Positions-Reference-Cited by-同舟云学术

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Method for Estimating Locations of Laser-Induced Stray Charges on Surface-Electrode Ion Traps Using Secular Frequency Shift at Multiple Ion Positions

Published:2023-07-17 Issue:1 Volume:20 Page:
ISSN:2331-7019
Container-title:Physical Review Applied
language:en
Short-container-title:Phys. Rev. Applied

Author:

Jung Changhyun^ORCID,Jeong Junho^ORCID,Yoo Seungwoo^ORCID,Kim Taehyun^ORCID,Cho Dongil “Dan”^ORCID

Funder

National Research Foundation of Korea

MSIT

Samsung Research Funding & Incubation Center of Samsung Electronics

Korean Government

Publisher

American Physical Society (APS)

Subject

General Physics and Astronomy

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevApplied.20.014032/fulltext

Reference40 articles.

1. Blueprint for a microwave trapped ion quantum computer

2. Benchmarking an 11-qubit quantum computer

3. Demonstration of the trapped-ion quantum CCD computer architecture

4. Gyroscopes based on surface acoustic waves

5. Industrially microfabricated ion trap with 1 eV trap depth

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Photoinduced charge-carrier dynamics in a semiconductor-based ion trap investigated via motion-sensitive qubit transitions;Physical Review A;2024-04-04

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