Multiple-charged secondary-ion emission from silicon and silicon oxide bombarded by heavy ions at energies of 0.4–10 MeV
Author:
Publisher
American Physical Society (APS)
Subject
Atomic and Molecular Physics, and Optics
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.51.554/fulltext
Reference21 articles.
1. On the excited state of sputtered particles
2. Direct Evidence of Electron Tunneling in the Ionization of Sputtered Atoms
3. Some problems encountered in secondary ion emission applied to elementary analysis
4. Bond Breaking and the Ionization of Sputtered Atoms
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