Secondary-electron emission by 0.5-MeV/u H, He, and Li ions specularly reflected from a SnTe(001) surface: Possibility of the surface track potential reducing the secondary-electron yield at a semiconductor surface-Reference-Cited by-同舟云学术

Secondary-electron emission by 0.5-MeV/u H, He, and Li ions specularly reflected from a SnTe(001) surface: Possibility of the surface track potential reducing the secondary-electron yield at a semiconductor surface

Published:2000-11-13 Issue:6 Volume:62 Page:
ISSN:1050-2947
Container-title:Physical Review A
language:en
Short-container-title:Phys. Rev. A

Author:

Kimura Kenji,Usui Satoshi,Nakajima Kaoru

Publisher

American Physical Society (APS)

Subject

Atomic and Molecular Physics, and Optics

Link

http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevA.62.062902/fulltext

Reference16 articles.

1. Secondary electron emission from thin foils under fast-ion bombardment

2. Secondary-electron yields from thin foils: A possible probe for the electronic stopping power of heavy ions

3. Projectile- and charge-state-dependent electron yields from ion penetration of solids as a probe of preequilibrium stopping power

4. Heavy ion track potentials in solids probed by electron yield measurements

5. Strong projectile-dependent forward-backward asymmetry of electron ejection by swift heavy ions in solids

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5. Quantum-mechanical model for valence-electron emission from metal surfaces;Physical Review A;2004-04-07