Observation of (5×5) Surface Reconstruction on Pure Silicon and its Stability Against Native-Oxide Formation
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.57.1332/fulltext
Reference11 articles.
1. Structural analysis of Si(111)‐7×7 by UHV‐transmission electron diffraction and microscopy
2. New Model for Reconstructed Si(111) 7 × 7 Surface Superlattices
3. 7×7 Reconstruction of Ge(111) Surfaces under Compressive Strain
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