Interface-State Measurements at Schottky Contacts: A New Admittance Technique
Author:
Publisher
American Physical Society (APS)
Subject
General Physics and Astronomy
Link
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.57.1080/fulltext
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1. Vereinfachte und erweiterte Theorie der Randschicht-gleichrichter
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5. Interface states in a cleaved metal‐silicon junction
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